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Signal Integrity Analysis Product Suites

DesignerSI™ is a set of specialized product suites for engineers designing various signaling architectures that include but are not limited to XAUI, XFI, Serial ATA, PCI Express, HDMI, and DDR. This easy to use design platform integrates rigorous EM analysis with circuit and system simulation in a highly accurate design flow for gigabit communication and memory applications.

Engineers using DesignerSI can leverage multiple signal integrity simulation methods such as traditional transient, fast convolution, statistical, and IBIS-AMI analyses in a single user interface. These methods utilize optimization algorithms, Design of Experiments (DoE), tuning, and post-processing for key signal-integrity metrics, such as TDR (time-domain reflectometry), BER (bit-error-rate), timing analysis and eye diagrams. The new Solver on Demand® technology in DesignerSI allows users to drive electromagnetic simulators (HFSS, PlanarEM) and circuit simulation tools (Nexxim® and Synopsys HSPICE®) directly from its layout based interface. DesignerSI 6.0 with Solver on Demand technology delivers the best in class design platform for signal- and power-integrity analysis.

Options

  • DesignerSI™ includes an integrated schematic capture and layout tools, 2D quasi-static field solver, circuit simulation (transient, fast convolution, statistical, and IBIS-AMI) and a design management front-end for Ansoft's best-in-class EM simulation products HFSS™, Q3D Extractor®, and SIwave™.

  • DesignerSI™ Circuit is targeted for engineers specifically interested in a transient, fast convolution, statistical, and IBIS-AMI circuit simulation solution. DesignerSI Circuit includes the same functionality as DesignerSI except for the 2D quasi-static field solver.

New in DesignerSI 6.0

  • HFSS Solver on Demand
  • Synopsys HSPICE Solver on Demand
  • Network Data Explorer for fast analysis of S/Y/Z parameters
  • Enhanced ECAD Integration to Cadence APD/SiP, and Allegro
    • Wirebonds, stacked die, cavities, etc.
  • Statistical IBIS-AMI
  • Patent Pending Macro-modeling solution for S-parameters
  • ODB++ Import